High-resolution X-ray luminescence extension imaging

نویسندگان

چکیده

Current X-ray imaging technologies involving flat-panel detectors have difficulty in three-dimensional objects because fabrication of large-area, flexible, silicon-based photodetectors on highly curved surfaces remains a challenge1–3. Here we demonstrate ultralong-lived trapping for flat-panel-free, high-resolution, using series solution-processable, lanthanide-doped nanoscintillators. Corroborated by quantum mechanical simulations defect formation and electronic structures, our experimental characterizations reveal that slow hopping trapped electrons due to radiation-triggered anionic migration host lattices can induce more than 30 days persistent radioluminescence. We further luminescence extension with resolution greater 20 line pairs per millimetre optical memory longer 15 days. These findings provide insight into mechanisms underlying energy conversion through enduring electron offer paradigm motivate future research wearable patient-centred radiography mammography, imaging-guided therapeutics, high-energy physics deep learning radiology. Using nanomaterials flexible substrates, an approach enables is demonstrated termed imaging.

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ژورنال

عنوان ژورنال: Nature

سال: 2021

ISSN: ['1476-4687', '0028-0836']

DOI: https://doi.org/10.1038/s41586-021-03251-6